Equipment
Equipment list
2026 version
2025 version
Material preparation Group [2025 version]
- 1-1 Electron Beam Lithography & Ion Milling System
- 1-2 Multi-Target Reactive Sputtering (Ion Beam Sputtering)
- 1-3 Reflection High Energy Electron Diffraction System
- 1-4 Multi-Ion Vapor Deposition System
- 1-5 Multi-Layer Chemical Vapor Deposition Reactor
- 1-6 Hot Working (Forging) Simulator
- 1-7 Spark Plasma Sintering SPS-1050
- 1-8 Spark Plasma Sintering SPS-3.20 Mark IV
- 1-9 Electron-beam Melting Furnace
- 1-10 Gas-atomization
- 1-11 High Frequency Induction Tilt Casting
- 1-12 Single Roll Melt Spinning
- 1-13 IR Image Furnace for Floating Zone Melting
- 1-14 Electron-beam Furnace for Floating Zone Melting
- 1-15 Crystal Growth Furnace with HF-inductive Heating System
- 1-16 Tungsten Resistivity Element Furnace for Vacuum Heating
- 1-17 High-frequency Induction Furnace
- 1-18 High-Temperature Floating Zone Furnace for Composite Ceramics
- 1-19 Vacuum Arc Melting Furnace for Small-size Ingot
- 1-20 Vacuum Arc Melting Furnace for Large-size Ingot
- 1-21 Arc-melting Furnace with Horizontal-traveling Hearth
- 1-22 Programmable Furnace with MoSi2 Heater
Material analysis group [2025 version]
- 2-1 Magnetic Property Measurement System
- 2-2 X-ray Diffractometer (Micro Area Type)
- 2-3 X-ray Diffractometer (Horizontal Sample Setting Type)
- 2-4 X-ray Photoelectron Spectrometer(XPS)
- 2-5 Field Emission Scanning Electron Microscope (FE-SEM)
- 2-6 Field Emission Electron Probe Micro Analyzer (FE-EPMA)
- 2-7 Scanning Electron Microscope (tungsten filament) (W-SEM)
- 2-8 Superconducting Quantum Interference Device (SQUID) Magnetometer
- 2-9 Differencial Scanning Calorimetry (DSC)
- 2-10 Conventional Type Thermal Analaysis Measurement System (DTA, DSC, TMA)
- 2-11 Wide and Small Angle X-ray Diffractometer (Rotating Anode X-ray Source)
- 2-12 Vibrating Sample Magnetometer (VSM)
- 2-13 Laue X-ray Back Scattering by Digital CCD Camera
- 2-14 Seebeck Coefficient/Electrical Resistivity Measurement System
- 2-15 Laser flash apparatus for Thermal Diffusivity and Conductivity Measurements (TC-7000S)
- 2-16 Static Particle Image Analyzer
- 2-17 Flat / Cross Section Ion Milling System
- 2-18 Micro Vickers Hardness Tester